Bulg. J. Phys. vol.27 no.S3 (2000), pp. 162-165



A Comparasion of Optical Properties of SnO2 Thin Films Prepared by Reactive Evaporation and Annealing

K. Ulutaş, D. Değer
Physics Department, University of Istanbul 34459-Vezneciler, Istanbul, Turkey
Abstract. We prepared SnO2 films by reactive evaporation and annealing of Sn. The film thicknesses are ranging between 500–7000 Å, by reactive evaporation. We calculated absorption coefficient of this films by measuring the transmittance using filters in the transmittance range of 400–1100 mm. We obtained variation of the absorption coefficient versus film thickness taking the wavelength as a parameter. Furthermore we research the variation of conductivity with film thickness. Thus we observed: 1. If the samples were made by reactive evaporation, both conductivity and absorption coefficient decreases as the film thickness increases; 2. If the samples were made by annealing of Sn, an increase of the absorption coefficient up to 2000 Å is followed by a decrease all the way up to 7000 Å and conductivity increases with thickness beyond 4000 Å.

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