Bulg. J. Phys. vol.35 no.3 (2008), pp. 213-222



Fabrication and Characterization of Cd0.4Sn0.6Te Thin Films Grown by Hot Wall Evaporation

T. Venkatachalam1, S. Ganesan2
1Department of Physics, Coimbatore Institute of Technology, Coimbatore-641014, India
2Department of Physics, Government College of Technology, Coimbatore-641013, India
Abstract. The cadmium tin telluride compound was prepared by direct reaction of its high purity elemental constituents using rotating furnace. Thin films were fabricated on glass substrates by hot wall vacuum evaporation technique. The X-ray diffraction studies revealed that all the films are face centered cubic structure. The EDAX studies showed the composition as Cd0.4Sn0.6Te. The UV-Vis-NIR optical transmittance spectrum of thin films of different thickness and different substrate temperatures were obtained and it was found that the optical band gap decreases with increase in substrate temperature and thickness of films.

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